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SPM 軟體

張貼者:2010年4月7日 下午12:12service orderble   [ eddie liu 已於 2010年6月14日 上午12:16 更新 ]

File:AFMsetup.jpgIn recent years, nano-technology has been a newly evolving field in the scientific and engineering world.  In order to manipulate and control nano-structures, there is a need for a highly proficient instrument to observe everything standing or moving in the nano-world.  The electron microscopes (EM, including Scanning Electron Microscope, SEM, and Transmission Electron Microscope, TEM) and the scanning probe microscopes (SPM, including Atomic Force Microscope, AFM, Scanning Tunneling Microscope, STM, etc…) are so far the only tools to spot the miniature yet elegant world.  With the help of EM and SPM to take our first step, we are able to view and take images in the nano-world.

Nanoscale Image Processor (NIP) is developed to assist users to obtain a clear picture of the nano-world.  Regardless of the type of data sources (SPM or EM), NIP is able to produce a clear image from your data and get rid of noise and disturbances.  The algorithms used to process the images not only preserve real data, but they also make an effort not to create any fake or false data.  In addition to analyzing image data in detail, NIP provides a new technique to combine image processing and experimental data analysis to help more and more demanding users.  With NIP, you can explore the nano-world precisely to assist your research, and it will become clear how much you can do with NIP once you start using it.





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eddie liu,
2010年4月7日 下午12:28
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